All images are © members of the Seidel Research Group and maybe reused with permission only.

09/2024 AFM and KPFM images of a 2D polycrystalline perovskite thin film (PEA₂(MA₁Pb₅I₁₆) showing orientation-dependent electrical surface potentials.
– tip: Pt
– measured by Tanzeela

 

ESM image
– LiCoO₂
– tip: Pt
– measured by Liang

 

04/2024 Electrochemical strain microscopy (ESM) image showing Li ion activity in the battery electrode material LiCoO₂

 

SNOM image
-FAPbI₃ (perovskite)
-tip: Pt
-measured by Jonghoon

 

04/2024 Near-field optical (SNOM ) image of a polycrystalline FAPbI₃ (perovskite) sample at a characteristic mid-infrared resonance of 1710 cm^-1.

MFM image
– NbSe₂
– tip: Co/Cr
– temperature: 4 K
– magnetic field: 30 mT
– dual pass lift (50 nm)
– measured by Adam

11/2022 Abrikosov vortex lattice in the type II van der Waals superconductor NbSe₂

 

STM image
– Nb:SrTiO₃, cleaved in UHV
– tip: Pt-Ir
– measured by Liang

 

10/2022 Unit cell terraces (3.9 Å) in UHV-cleaved niobium-doped SrTiO₃

 

PFM amplitude and phase images
– sample: CIPS
– measured by Lei

 

10/2022 Nanoscale phase separation in ferroelectric copper indium thiophosphate (CIPS)

 

 

PFM phase image

– sample: BiFeO₃/SrTiO₃ (cross section)
– measured by Haoze

 

 

11/2022 High resolution PFM image of a FIB cross section of a BiFeO₃ thin film on SrTiO₃

 

 

PFM phase image
– sample: MoS₂ on PVDF
– measured by Dawei

 

11/2022 Nanoscale piezoresponse image of MoS₂ on polyvinylidene fluoride (PVDF)

 

Nanostructured device imaging
– sample: WTe₂ flake (red) with Pt top electrode (white)
– tip: Pt
– measured by Pankaj

 

 

 

07/2018   2D material flake (red) with lithographic Pt top electrode (white) on Si

 

PFM (Topography signal)
– sample: PMN-30%PT single crystal
– tip: Pt
– measured by Dawei

 

 

05/2018   Naturally occuring domain structure in a PMN-PT single crystal

 

“Blocky” AFM, parts courtesy of Park Systems Inc., assembled by Fei

 

Room temperature STM
– sample: HOPG
– tip: Pt/Ir
– bias: 30mV
– tunnelling current: 0.8nA
– measured by Fei Hou

 

11/2017   Atomic structure of a graphite surface

 

Bias-assisted AFM lithography / KPFM
– sample: LaAlO₃/SrTiO₃
– tip: Pt
– measured by Fan Ji

 

10/2017    Patterned 2-DEG at LaAlO₃/SrTiO₃ interface seen as change in surface potential

 

Bias-assisted vector lithography / PFM
– sample: LaAlO₃/SrTiO₃
– tip: Pt
– measured by Fan Ji

09/2017    FLEET logo written into 2-DEG at LaAlO₃/SrTiO₃ interface

 

MFM
– sample: SrCoO₃
– tip: Co/Cr
– temperature: 3.8 K
– dual pass lift (30 nm)
– measured by Songbai Hu

 

09/2016 Magnetic domain structure of a SrCoO₃ thin film at 3.8K

c-AFM
– sample: SrCoO₃
– tip: Pt
– Vs = 1.7 V
– measured by Songbai Hu

 

 

08/2016    Conductive islands in a 40 nm thick oxidized SrCoO₃ thin film on SrTiO₃ (100)

MFM
– sample: FeV₂O₄
– tip: Co/Cr
– temperature: 10 K
– constant height (50 nm)
– image size: 3 μm × 3 μm
– measured by Dohyung Kim

 

07/2016    Magnetic domain structure of an iron vanadate thin film in 3 T and -3 T magnetic fields

 

STM
– sample: Si (111) – 7 × 7
– tip: Pt/Ir on qPlus sensor
– temperature: 16 K Vs = 1.7 V, I = 0.2 nA
– image size: 20 nm × 20 nm (512 x 512)
– measured by Byoung Choi

 

06/2016   Atomic structure of a silicon surface

 

Ferroics retreat, Kangaroo Valley 2017

Ferroics retreat, Kangaroo Valley 2016